ayman-codes / Wafer-Defect-detection-project Star 0 Code Issues Pull requests Production-grade MLOps pipeline for real-time multi-label classification of integrated circuit wafer defects utilizing ASVD-compressed Convolutional Neural Networks and continuous covariate shift monitoring. computer-vision focal-loss semiconductor-manufacturing mlops data-drift-detection asvd-compression Updated Apr 24, 2026 Jupyter Notebook